Notices. DEPARTMENT OF COMMERCE
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/register/2012/08/30/2012-21453A research copy — for the controlling text, always check the official state or federal source. Not legal advice.
BILLING CODE 3510-DS-P DEPARTMENT OF COMMERCE International Trade Administration University of Wisconsin—Madison, et al.; Notice of Consolidated Decision on Applications for Duty-Free Entry of Electron Microscope This is a decision consolidated pursuant to Section 6(c) of the Educational, Scientific, and Cultural Materials Importation Act of 1966 (Pub. L. 89-651, as amended by Pub. L. 106-36; 80 Stat. 897; 15 CFR part 301). Related records can be viewed between 8:30 a.m. and 5 p.m. in Room 3720, U.S.
Department of Commerce, 14th and Constitution Avenue NW., Washington, DC *Docket Number:* 12-026. *Applicant:* University of Wisconsin—Madison, Madison, WI 53715-1218. *Instrument:* Electron Microscope. *Manufacturer:* FEI Company, the Netherlands. *Intended Use:* See notice at 77 FR 42484, July 19, 2012. *Docket Number:* 12-029. *Applicant:* University of Alabama at Birmingham, Birmingham, AL 35294-4461. *Instrument:* Electron Microscope. *Manufacturer:* FEI Company, Czech Republic. *Intended Use:* See notice at 77 FR 42484, July 19, 2012. *Docket Number:* 12-030. *Applicant:* Ohio State University, Columbus, OH 43210. *Instrument:* Electron Microscope. *Manufacturer:* FEI Company, the Netherlands. *Intended Use:* See notice at 77 FR 42484, July 19, 2012. *Docket Number:* 12-032. *Applicant:* Louisiana State University, Baton Rouge, LA 70803-1715. *Instrument:* Electron Microscope. *Manufacturer:* JEOL, Ltd., Japan. *Intended Use:* See notice at 77 FR 42484, July 19, 2012. *Comments:* None received. *Decision:* Approved.
No instrument of equivalent scientific value to the foreign instrument, for such purposes as this instrument is intended to be used, is being manufactured in the United States at the time the instrument was ordered. *Reasons:* Each foreign instrument is an electron microscope and is intended for research or scientific educational uses requiring an electron microscope. We know of no electron microscope, or any other instrument suited to these purposes, which was being manufactured in the United States at the time of order of each instrument.
Dated: August 20, 2012. Gregory W. Campbell, Director, Subsidies Enforcement Office, Import Administration. [FR Doc. 2012-21453 Filed 8-29-12; 8:45 am]
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- Pub. L. 89-651
- Pub. L. 106-36
- 15 CFR 301
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Notices
DEPARTMENT OF COMMERCE
Pub. L.Pub. L. 89-651
Pub. L.Pub. L. 106-36
Cite15 CFR 301
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